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VLSI test principles and architectures : design for testability

Wang, Laung-Terng

VLSI test principles and architectures : design for testability - New Delhi: Elsevier/Morgan Kaufmann, 2013. - xxx, 774 p.

ISBN: 9789380501550

Subjects--Topical Terms:
Architectures
Vlsi test principles

Dewey Class. No.: 621.395 WAN

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