Pattern classification
Material type:
TextPublication details: New Delhi: Wiley India, 2017Edition: 2nd edDescription: xx, 654 pISBN: 9788126511167Subject(s): Image analysis | Multilayer neural networks | Bayesian parameter estimationDDC classification: 006.4 DUD
| Item type | Current library | Collection | Shelving location | Call number | Materials specified | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|---|
| Engineering Books | Presidency University Library | Non-Fiction | Computer Science Engineering | 006.4 DUD (Browse shelf(Opens below)) | Available | 35604 |
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| 006.4 BIS Pattern recognition and machine learning | 006.4 BIS Pattern recognition and machine learning | 006.4 BUN Applied pattern recognition | 006.4 DUD Pattern classification | 006.4 DUD Pattern recognition | 006.4 GOS Pattern recognition and image analysis | 006.4 GOS Pattern recognition and image analysis |
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