Essentials of electronic testing for digital, memory and mixed-signal vlsi circuits for Digital, Memory and Mixed-Signal VLSI circuits

By: Bushnell, Michael LContributor(s): Agrawal, Vishwani, D [Contributor]Material type: TextTextPublication details: Boston : Kluwer academic, 2000Description: xvii, 690 pISBN: 9788132233299Subject(s): Electrical Engineering | Electrical EngineeringDDC classification: 621.395 BUS
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Item type Current library Shelving location Call number Materials specified Status Date due Barcode
Engineering Books Presidency University Library
Electrical and Electronics Engineering 621.395 BUS (Browse shelf(Opens below)) Available 59875
Engineering Books Presidency University Library
Electrical and Electronics Engineering 621.395 BUS (Browse shelf(Opens below)) Available 59876

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