Bunke, Horst <br/><br/>
Applied pattern recognition 

 - New Delhi:  Springer,  2008. 
 - xi, 245 p. 
<br/><br/><label>ISBN: </label>9788184898729 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern recognition systems<br/>Facial image processing<br/>Texture analysis
<br/><br/><label>Dewey Class. No.: </label>006.4 BUN