TY  - BOOK
AU  - Bunke, Horst
AU  - Kandel, Abraham
AU  - Last, Mark
TI  - Applied pattern recognition
SN  - 9788184898729
U1  - 006.4 BUN 
PY  - 2008///
CY  - New Delhi
PB  - Springer
KW  - Pattern recognition systems
KW  - Facial image processing
KW  - Texture analysis
ER  -