Wang, Laung-Terng <br/><br/>
VLSI test principles and architectures :  design for testability 

 - New Delhi:  Elsevier/Morgan Kaufmann,  2013. 
 - xxx, 774 p. 
<br/><br/><label>ISBN: </label>9789380501550 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Architectures<br/>Vlsi test principles
<br/><br/><label>Dewey Class. No.: </label>621.395 WAN