TY  - BOOK
AU  - Wang, Laung-Terng
AU  - Wu, Cheng Wen
AU  - Wen, Xiaoqing
TI  - VLSI test principles and architectures: design for testability
SN  - 9789380501550
U1  - 621.395 WAN 
PY  - 2013///
CY  - New Delhi
PB  - Elsevier/Morgan Kaufmann
KW  - Architectures
KW  - Vlsi test principles
ER  -