VLSI testing : digital and mixed analogue/digital techniques

By: Hurst, Stanley LContributor(s): Haigh, D. G [Series Editor] | Soin, R. S [Series Editor] | Wood, J [Series Editor]Material type: TextTextSeries: IEE Circuits, Devices and Systems Series | ; Vol. 9 | ; Vol. 9Publication details: London: The Institution of Electrical Engineers, 2017Description: xx, 532 pISBN: 0852969015; 9780852969014Subject(s): Digital integrated circuits--Testing | Integrated circuits | Integrated circuits--TestingDDC classification: 621.3 HUR
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Item type Current library Shelving location Call number Materials specified Status Date due Barcode
Engineering Books Presidency University Library
Electronics and Communication Engineering 621.3 HUR (Browse shelf(Opens below)) Available 48649

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