000			00577nam a2200169Ia 4500
008			240312s9999 xx 000 0 und d
020			_a9788132233299
082			_a621.395 BUS
100			_aBushnell, Michael L.
245			_aEssentials of electronic testing for digital, memory and mixed-signal vlsi circuits _bfor Digital, Memory and Mixed-Signal VLSI circuits
260			_aBoston : _bKluwer academic, _c2000.
300			_axvii, 690 p.
650			_aElectrical Engineering
650			_aElectrical Engineering
700			_aAgrawal, Vishwani, D. _eCON
942			_cEBK
999			_c52044 _d52044