| 000 | 00549nam a2200193Ia 4500 | ||
|---|---|---|---|
| 008 | 221011s9999 xx 000 0 und d | ||
| 020 | _a9789380501550 | ||
| 040 | _aPUL | ||
| 082 | _a621.395 WAN | ||
| 100 |
_aWang, Laung-Terng _eEDI |
||
| 245 | 0 |
_aVLSI test principles and architectures : _bdesign for testability |
|
| 260 |
_aNew Delhi: _bElsevier/Morgan Kaufmann, _c2013. |
||
| 300 | _axxx, 774 p. | ||
| 650 | _aArchitectures | ||
| 650 | _aVlsi test principles | ||
| 700 |
_aWu, Cheng Wen _eEDI |
||
| 700 |
_aWen, Xiaoqing _eEDI |
||
| 942 | _cBK | ||
| 999 |
_c9030 _d9030 |
||