VLSI test principles and architectures : design for testability
Material type:
TextPublication details: New Delhi: Elsevier/Morgan Kaufmann, 2013Description: xxx, 774 pISBN: 9789380501550Subject(s): Architectures | Vlsi test principlesDDC classification: 621.395 WAN
| Item type | Current library | Collection | Shelving location | Call number | Materials specified | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|---|
| Engineering Books | Presidency University Library | Non-Fiction | Computer Science Engineering | 621.395 WAN (Browse shelf(Opens below)) | Available | 19955 | ||
| Engineering Books | Presidency University Library | Non-Fiction | Computer Science Engineering | 621.395 WAN (Browse shelf(Opens below)) | Available | 19956 | ||
| Engineering Books | Presidency University Library | Non-Fiction | Computer Science Engineering | 621.395 WAN (Browse shelf(Opens below)) | Available | 19957 | ||
| Engineering Books | Presidency University Library | Non-Fiction | Computer Science Engineering | 621.395 WAN (Browse shelf(Opens below)) | Available | 19958 | ||
| Engineering Books | Presidency University Library | Non-Fiction | Computer Science Engineering | 621.395 WAN (Browse shelf(Opens below)) | Available | 19959 |
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| 621.395 WAN VLSI test principles and architectures : design for testability | 621.395 WAN VLSI test principles and architectures : design for testability | 621.395 WAN VLSI test principles and architectures : design for testability | 621.395 WAN VLSI test principles and architectures : design for testability | 621.395 YAR Digital logic : | 621.395 YAR Digital logic : | 621.395 YAR Digital logic : |
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